Daily Papers

We introduce a novel neural network, SkyReconNet, which combines the expanded receptive fields of dilated convolutional layers along with standard convolutions, to capture both the global and local features for reconstructing the missing information in an image. We implement our network to inpaint the masked regions in a full-sky Cosmic Microwave Background (CMB) map. Inpainting CMB maps is a particularly formidable challenge when dealing with extensive and irregular masks, such as galactic masks which can obscure substantial fractions of the sky. The hybrid design of SkyReconNet leverages the strengths of standard and dilated convolutions to accurately predict CMB fluctuations in the masked regions, by effectively utilizing the information from surrounding unmasked areas. During training, the network optimizes its weights by minimizing a composite loss function that combines the Structural Similarity Index Measure (SSIM) and mean squared error (MSE). SSIM preserves the essential structural features of the CMB, ensuring an accurate and coherent reconstruction of the missing CMB fluctuations, while MSE minimizes the pixel-wise deviations, enhancing the overall accuracy of the predictions. The predicted CMB maps and their corresponding angular power spectra align closely with the targets, achieving the performance limited only by the fundamental uncertainty of cosmic variance. The network's generic architecture enables application to other physics-based challenges involving data with missing or defective pixels, systematic artefacts etc. Our results demonstrate its effectiveness in addressing the challenges posed by large irregular masks, offering a significant inpainting tool not only for CMB analyses but also for image-based experiments across disciplines where such data imperfections are prevalent.

In industrial settings, surface defects on steel can significantly compromise its service life and elevate potential safety risks. Traditional defect detection methods predominantly rely on manual inspection, which suffers from low efficiency and high costs. Although automated defect detection approaches based on Convolutional Neural Networks(e.g., Mask R-CNN) have advanced rapidly, their reliability remains challenged due to data annotation uncertainties during deep model training and overfitting issues. These limitations may lead to detection deviations when processing the given new test samples, rendering automated detection processes unreliable. To address this challenge, we first evaluate the detection model's practical performance through calibration data that satisfies the independent and identically distributed (i.i.d) condition with test data. Specifically, we define a loss function for each calibration sample to quantify detection error rates, such as the complement of recall rate and false discovery rate. Subsequently, we derive a statistically rigorous threshold based on a user-defined risk level to identify high-probability defective pixels in test images, thereby constructing prediction sets (e.g., defect regions). This methodology ensures that the expected error rate (mean error rate) on the test set remains strictly bounced by the predefined risk level. Additionally, we observe a negative correlation between the average prediction set size and the risk level on the test set, establishing a statistically rigorous metric for assessing detection model uncertainty. Furthermore, our study demonstrates robust and efficient control over the expected test set error rate across varying calibration-to-test partitioning ratios, validating the method's adaptability and operational effectiveness.

Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.

Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality. While recent dense-feedback methods move beyond scalar supervision, their heatmap-centric representations still formulate diagnosis as pixel-field regression, making it difficult to localize variable-cardinality defects and bind semantic reasons to individual failures. To address this representation bottleneck, we propose Structured Defect Grounding (SDG), which casts T2I diagnosis as structured set prediction by modeling each defect as a (location, type, reason, importance) tuple. To make this formulation trainable and measurable, we introduce SDG-30K, a 30K-image dataset with box-grounded annotations across four modern T2I generators, together with a dedicated evaluation protocol, SDG-Eval. Building on this structured representation, we further present a diagnosis-to-alignment framework in which a Vision-Language Model (VLM) serves as the SDG detector, and BoxFlow-GRPO converts predicted defect sets into box-derived, importance-weighted spatial rewards for diffusion model alignment. Extensive experiments show that our SDG detector outperforms leading proprietary VLMs on structured defect grounding, while SDG-guided rewards consistently improve T2I alignment and support localized image refinement. These results establish SDG as a unified, instance-level interface for diagnosing, evaluating, and enhancing modern generative models.

In anomaly segmentation for complex driving scenes, state-of-the-art approaches utilize anomaly scoring functions to calculate anomaly scores. For these functions, accurately predicting the logits of inlier classes for each pixel is crucial for precisely inferring the anomaly score. However, in real-world driving scenarios, the diversity of scenes often results in distorted manifolds of pixel embeddings in the space. This effect is not conducive to directly using the pixel embeddings for the logit prediction during inference, a concern overlooked by existing methods. To address this problem, we propose a novel method called Random Walk on Pixel Manifolds (RWPM). RWPM utilizes random walks to reveal the intrinsic relationships among pixels to refine the pixel embeddings. The refined pixel embeddings alleviate the distortion of manifolds, improving the accuracy of anomaly scores. Our extensive experiments show that RWPM consistently improve the performance of the existing anomaly segmentation methods and achieve the best results. Code is available at: https://github.com/ZelongZeng/RWPM.

The crux of label-efficient semantic segmentation is to produce high-quality pseudo-labels to leverage a large amount of unlabeled or weakly labeled data. A common practice is to select the highly confident predictions as the pseudo-ground-truths for each pixel, but it leads to a problem that most pixels may be left unused due to their unreliability. However, we argue that every pixel matters to the model training, even those unreliable and ambiguous pixels. Intuitively, an unreliable prediction may get confused among the top classes, however, it should be confident about the pixel not belonging to the remaining classes. Hence, such a pixel can be convincingly treated as a negative key to those most unlikely categories. Therefore, we develop an effective pipeline to make sufficient use of unlabeled data. Concretely, we separate reliable and unreliable pixels via the entropy of predictions, push each unreliable pixel to a category-wise queue that consists of negative keys, and manage to train the model with all candidate pixels. Considering the training evolution, we adaptively adjust the threshold for the reliable-unreliable partition. Experimental results on various benchmarks and training settings demonstrate the superiority of our approach over the state-of-the-art alternatives.

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely limited by the scarcity of data, as the production of real semiconductor wafer data for training these models involves high financial and time costs. Moreover, the existing simulation methods fall short of replicating images with identical noise characteristics, surface roughness and stochastic variations at advanced nodes. We propose a method for generating synthetic semiconductor SEM images using a diffusion model within a limited data regime. In contrast to images generated through conventional simulation methods, SEM images generated through our proposed DL method closely resemble real SEM images, replicating their noise characteristics and surface roughness adaptively. Our main contributions, which are validated on three different real semiconductor datasets, are: i) proposing a patch-based generative framework utilizing DDPM to create SEM images with intended defect classes, addressing challenges related to class-imbalance and data insufficiency, ii) demonstrating generated synthetic images closely resemble real SEM images acquired from the tool, preserving all imaging conditions and metrology characteristics without any metadata supervision, iii) demonstrating a defect detector trained on generated defect dataset, either independently or combined with a limited real dataset, can achieve similar or improved performance on real wafer SEM images during validation/testing compared to exclusive training on a real defect dataset, iv) demonstrating the ability of the proposed approach to transfer defect types, critical dimensions, and imaging conditions from one specified CD/Pitch and metrology specifications to another, thereby highlighting its versatility.

Precise optical inspection in industrial applications is crucial for minimizing scrap rates and reducing the associated costs. Besides merely detecting if a product is anomalous or not, it is crucial to know the distinct type of defect, such as a bent, cut, or scratch. The ability to recognize the "exact" defect type enables automated treatments of the anomalies in modern production lines. Current methods are limited to solely detecting whether a product is defective or not without providing any insights on the defect type, nevertheless detecting and identifying multiple defects. We propose MultiADS, a zero-shot learning approach, able to perform Multi-type Anomaly Detection and Segmentation. The architecture of MultiADS comprises CLIP and extra linear layers to align the visual- and textual representation in a joint feature space. To the best of our knowledge, our proposal, is the first approach to perform a multi-type anomaly segmentation task in zero-shot learning. Contrary to the other baselines, our approach i) generates specific anomaly masks for each distinct defect type, ii) learns to distinguish defect types, and iii) simultaneously identifies multiple defect types present in an anomalous product. Additionally, our approach outperforms zero/few-shot learning SoTA methods on image-level and pixel-level anomaly detection and segmentation tasks on five commonly used datasets: MVTec-AD, Visa, MPDD, MAD and Real-IAD.

Flicker artifacts in short-exposure images are caused by the interplay between the row-wise exposure mechanism of rolling shutter cameras and the temporal intensity variations of alternating current (AC)-powered lighting. These artifacts typically appear as uneven brightness distribution across the image, forming noticeable dark bands. Beyond compromising image quality, this structured noise also affects high-level tasks, such as object detection and tracking, where reliable lighting is crucial. Despite the prevalence of flicker, the lack of a large-scale, realistic dataset has been a significant barrier to advancing research in flicker removal. To address this issue, we present BurstDeflicker, a scalable benchmark constructed using three complementary data acquisition strategies. First, we develop a Retinex-based synthesis pipeline that redefines the goal of flicker removal and enables controllable manipulation of key flicker-related attributes (e.g., intensity, area, and frequency), thereby facilitating the generation of diverse flicker patterns. Second, we capture 4,000 real-world flicker images from different scenes, which help the model better understand the spatial and temporal characteristics of real flicker artifacts and generalize more effectively to wild scenarios. Finally, due to the non-repeatable nature of dynamic scenes, we propose a green-screen method to incorporate motion into image pairs while preserving real flicker degradation. Comprehensive experiments demonstrate the effectiveness of our dataset and its potential to advance research in flicker removal.

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

Flicker artifacts, arising from unstable illumination and row-wise exposure inconsistencies, pose a significant challenge in short-exposure photography, severely degrading image quality. Unlike typical artifacts, e.g., noise and low-light, flicker is a structured degradation with specific spatial-temporal patterns, which are not accounted for in current generic restoration frameworks, leading to suboptimal flicker suppression and ghosting artifacts. In this work, we reveal that flicker artifacts exhibit two intrinsic characteristics, periodicity and directionality, and propose Flickerformer, a transformer-based architecture that effectively removes flicker without introducing ghosting. Specifically, Flickerformer comprises three key components: a phase-based fusion module (PFM), an autocorrelation feed-forward network (AFFN), and a wavelet-based directional attention module (WDAM). Based on the periodicity, PFM performs inter-frame phase correlation to adaptively aggregate burst features, while AFFN exploits intra-frame structural regularities through autocorrelation, jointly enhancing the network's ability to perceive spatially recurring patterns. Moreover, motivated by the directionality of flicker artifacts, WDAM leverages high-frequency variations in the wavelet domain to guide the restoration of low-frequency dark regions, yielding precise localization of flicker artifacts. Extensive experiments demonstrate that Flickerformer outperforms state-of-the-art approaches in both quantitative metrics and visual quality. The source code is available at https://github.com/qulishen/Flickerformer.

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

Recent development of Under-Display Camera (UDC) systems provides a true bezel-less and notch-free viewing experience on smartphones (and TV, laptops, tablets), while allowing images to be captured from the selfie camera embedded underneath. In a typical UDC system, the microstructure of the semi-transparent organic light-emitting diode (OLED) pixel array attenuates and diffracts the incident light on the camera, resulting in significant image quality degradation. Oftentimes, noise, flare, haze, and blur can be observed in UDC images. In this work, we aim to analyze and tackle the aforementioned degradation problems. We define a physics-based image formation model to better understand the degradation. In addition, we utilize one of the world's first commodity UDC smartphone prototypes to measure the real-world Point Spread Function (PSF) of the UDC system, and provide a model-based data synthesis pipeline to generate realistically degraded images. We specially design a new domain knowledge-enabled Dynamic Skip Connection Network (DISCNet) to restore the UDC images. We demonstrate the effectiveness of our method through extensive experiments on both synthetic and real UDC data. Our physics-based image formation model and proposed DISCNet can provide foundations for further exploration in UDC image restoration, and even for general diffraction artifact removal in a broader sense.

The crux of semi-supervised semantic segmentation is to assign adequate pseudo-labels to the pixels of unlabeled images. A common practice is to select the highly confident predictions as the pseudo ground-truth, but it leads to a problem that most pixels may be left unused due to their unreliability. We argue that every pixel matters to the model training, even its prediction is ambiguous. Intuitively, an unreliable prediction may get confused among the top classes (i.e., those with the highest probabilities), however, it should be confident about the pixel not belonging to the remaining classes. Hence, such a pixel can be convincingly treated as a negative sample to those most unlikely categories. Based on this insight, we develop an effective pipeline to make sufficient use of unlabeled data. Concretely, we separate reliable and unreliable pixels via the entropy of predictions, push each unreliable pixel to a category-wise queue that consists of negative samples, and manage to train the model with all candidate pixels. Considering the training evolution, where the prediction becomes more and more accurate, we adaptively adjust the threshold for the reliable-unreliable partition. Experimental results on various benchmarks and training settings demonstrate the superiority of our approach over the state-of-the-art alternatives.

Internal defect detection constitutes a critical process in ensuring component quality, for which anomaly detection serves as an effective solution. However, existing anomaly detection datasets predominantly focus on surface defects in visible-light images, lacking publicly available X-ray datasets targeting internal defects in components. To address this gap, we construct the first publicly accessible component X-ray anomaly detection (CXR-AD) dataset, comprising real-world X-ray images. The dataset covers five industrial component categories, including 653 normal samples and 561 defect samples with precise pixel-level mask annotations. We systematically analyze the dataset characteristics and identify three major technical challenges: (1) strong coupling between complex internal structures and defect regions, (2) inherent low contrast and high noise interference in X-ray imaging, and (3) significant variations in defect scales and morphologies. To evaluate dataset complexity, we benchmark three state-of-the-art anomaly detection frameworks (feature-based, reconstruction-based, and zero-shot learning methods). Experimental results demonstrate a 29.78% average performance degradation on CXR-AD compared to MVTec AD, highlighting the limitations of current algorithms in handling internal defect detection tasks. To the best of our knowledge, CXR-AD represents the first publicly available X-ray dataset for component anomaly detection, providing a real-world industrial benchmark to advance algorithm development and enhance precision in internal defect inspection technologies.

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

Accurate defect segmentation is critical for industrial inspection, yet dense pixel-level annotations are rarely available. A common workaround is to convert inexpensive bounding boxes into pseudo-masks using foundation segmentation models such as the Segment Anything Model (SAM). However, these pseudo-labels are systematically noisy on industrial surfaces, often hallucinating background structure while missing sparse defects. To address this limitation, a noise-robust box-to-pixel distillation framework, Boxes2Pixels, is proposed that treats SAM as a noisy teacher rather than a source of ground-truth supervision. Bounding boxes are converted into pseudo-masks offline by SAM, and a compact student is trained with (i) a hierarchical decoder over frozen DINOv2 features for semantic stability, (ii) an auxiliary binary localization head to decouple sparse foreground discovery from class prediction, and (iii) a one-sided online self-correction mechanism that relaxes background supervision when the student is confident, targeting teacher false negatives. On a manually annotated wind turbine inspection benchmark, the proposed Boxes2Pixels improves anomaly mIoU by +6.97 and binary IoU by +9.71 over the strongest baseline trained under identical weak supervision. Moreover, online self-correction increases the binary recall by +18.56, while the model employs 80\% fewer trainable parameters. Code is available at https://github.com/CLendering/Boxes2Pixels.

Printed Circuit Boards are the foundation for the functioning of any electronic device, and therefore are an essential component for various industries such as automobile, communication, computation, etc. However, one of the challenges faced by the PCB manufacturers in the process of manufacturing of the PCBs is the faulty placement of its components including missing components. In the present scenario the infrastructure required to ensure adequate quality of the PCB requires a lot of time and effort. The authors present a novel solution for detecting missing components and classifying them in a resourceful manner. The presented algorithm focuses on pixel theory and object detection, which has been used in combination to optimize the results from the given dataset.

Gaussian Splatting has emerged as a prominent 3D representation in novel view synthesis, but it still suffers from appearance variations, which are caused by various factors, such as modern camera ISPs, different time of day, weather conditions, and local light changes. These variations can lead to floaters and color distortions in the rendered images/videos. Recent appearance modeling approaches in Gaussian Splatting are either tightly coupled with the rendering process, hindering real-time rendering, or they only account for mild global variations, performing poorly in scenes with local light changes. In this paper, we propose DAVIGS, a method that decouples appearance variations in a plug-and-play and efficient manner. By transforming the rendering results at the image level instead of the Gaussian level, our approach can model appearance variations with minimal optimization time and memory overhead. Furthermore, our method gathers appearance-related information in 3D space to transform the rendered images, thus building 3D consistency across views implicitly. We validate our method on several appearance-variant scenes, and demonstrate that it achieves state-of-the-art rendering quality with minimal training time and memory usage, without compromising rendering speeds. Additionally, it provides performance improvements for different Gaussian Splatting baselines in a plug-and-play manner.

Many videos contain flickering artifacts. Common causes of flicker include video processing algorithms, video generation algorithms, and capturing videos under specific situations. Prior work usually requires specific guidance such as the flickering frequency, manual annotations, or extra consistent videos to remove the flicker. In this work, we propose a general flicker removal framework that only receives a single flickering video as input without additional guidance. Since it is blind to a specific flickering type or guidance, we name this "blind deflickering." The core of our approach is utilizing the neural atlas in cooperation with a neural filtering strategy. The neural atlas is a unified representation for all frames in a video that provides temporal consistency guidance but is flawed in many cases. To this end, a neural network is trained to mimic a filter to learn the consistent features (e.g., color, brightness) and avoid introducing the artifacts in the atlas. To validate our method, we construct a dataset that contains diverse real-world flickering videos. Extensive experiments show that our method achieves satisfying deflickering performance and even outperforms baselines that use extra guidance on a public benchmark.

Recent Anomaly Detection methods achieve perfect detection and segmentation scores on well-established datasets, such as MVTec. However, many of these methods face challenges when foundational assumptions - such as consistent object scale, viewpoint, background, illumination, and centered placement - are violated. Those variations that occur render anomaly detection methods unusable in many real-world scenarios. To address these limitations, we introduce three key contributions: (1) a visual prompting pipeline that isolates objects using foreground-background masking; (2) a mechanism for unfreezing the teacher in student-teacher models to improve domain adaptability; and (3) a data augmentation strategy leveraging diffusion-generated synthetic images to enhance anomaly detection performance. We achieve a 3.5 percentage point improvement over the previous state-of-the-art on the challenging AeBAD dataset by using the Masked Multiscale Reconstruction (MMR) model as our backbone.

Existing deep learning based image inpainting methods use a standard convolutional network over the corrupted image, using convolutional filter responses conditioned on both valid pixels as well as the substitute values in the masked holes (typically the mean value). This often leads to artifacts such as color discrepancy and blurriness. Post-processing is usually used to reduce such artifacts, but are expensive and may fail. We propose the use of partial convolutions, where the convolution is masked and renormalized to be conditioned on only valid pixels. We further include a mechanism to automatically generate an updated mask for the next layer as part of the forward pass. Our model outperforms other methods for irregular masks. We show qualitative and quantitative comparisons with other methods to validate our approach.

Generative single-image super-resolution (SISR) is advancing rapidly, yet even state-of-the-art models produce visual artifacts: unnatural patterns and texture distortions that degrade perceived quality. These defects vary widely in perceptual impact--some are barely noticeable, while others are highly disturbing--yet existing detection methods treat them equally. We propose characterizing artifacts by their prominence to human observers rather than as uniform binary defects. We present a novel dataset of 1302 artifact examples from 11 SISR methods annotated with crowdsourced prominence scores, and provide prominence annotations for 593 existing artifacts from the DeSRA dataset, revealing that 48% of them go unnoticed by most viewers. Building on this data, we train a lightweight regressor that produces spatial prominence heatmaps. We demonstrate that our method outperforms existing detectors and effectively guides SR model fine-tuning for artifact suppression. Our dataset and code are available at https://tinyurl.com/2u9zxtyh.

In this work, we introduce Pixelsmith, a zero-shot text-to-image generative framework to sample images at higher resolutions with a single GPU. We are the first to show that it is possible to scale the output of a pre-trained diffusion model by a factor of 1000, opening the road for gigapixel image generation at no additional cost. Our cascading method uses the image generated at the lowest resolution as a baseline to sample at higher resolutions. For the guidance, we introduce the Slider, a tunable mechanism that fuses the overall structure contained in the first-generated image with enhanced fine details. At each inference step, we denoise patches rather than the entire latent space, minimizing memory demands such that a single GPU can handle the process, regardless of the image's resolution. Our experimental results show that Pixelsmith not only achieves higher quality and diversity compared to existing techniques, but also reduces sampling time and artifacts. The code for our work is available at https://github.com/Thanos-DB/Pixelsmith.

Reliable anomaly detection in photovoltaic (PV) modules is critical for maintaining solar energy efficiency. However, developing robust computer vision models for PV inspection is constrained by the scarcity of large-scale, diverse, and balanced datasets. This study introduces PV-DDPM, a spatially conditioned denoising diffusion probabilistic model that generates anomalous electroluminescence (EL) images across four PV cell types: multi-crystalline silicon (multi-c-Si), mono-crystalline silicon (mono-c-Si), half-cut multi-c-Si, and interdigitated back contact (IBC) with dogbone interconnect. PV-DDPM enables controlled synthesis of single-defect and multi-defect scenarios by conditioning on binary masks representing structural features and defect positions. To the best of our knowledge, this is the first framework that jointly models multiple PV cell types while supporting simultaneous generation of diverse anomaly types. We also introduce E-SCDD, an enhanced version of the SCDD dataset, comprising 1,000 pixel-wise annotated EL images spanning 30 semantic classes, and 1,768 unlabeled synthetic samples. Quantitative evaluation shows our generated images achieve a Fréchet Inception Distance (FID) of 4.10 and Kernel Inception Distance (KID) of 0.0023 pm 0.0007 across all categories. Training the vision--language anomaly detection model AA-CLIP on E-SCDD, compared to the SCDD dataset, improves pixel-level AUC and average precision by 1.70 and 8.34 points, respectively.

While recent advancing image super-resolution (SR) techniques are continually improving the perceptual quality of their outputs, they can usually fail in quantitative evaluations. This inconsistency leads to a growing distrust in existing image metrics for SR evaluations. Though image evaluation depends on both the metric and the reference ground truth (GT), researchers typically do not inspect the role of GTs, as they are generally accepted as `perfect' references. However, due to the data being collected in the early years and the ignorance of controlling other types of distortions, we point out that GTs in existing SR datasets can exhibit relatively poor quality, which leads to biased evaluations. Following this observation, in this paper, we are interested in the following questions: Are GT images in existing SR datasets 100% trustworthy for model evaluations? How does GT quality affect this evaluation? And how to make fair evaluations if there exist imperfect GTs? To answer these questions, this paper presents two main contributions. First, by systematically analyzing seven state-of-the-art SR models across three real-world SR datasets, we show that SR performances can be consistently affected across models by low-quality GTs, and models can perform quite differently when GT quality is controlled. Second, we propose a novel perceptual quality metric, Relative Quality Index (RQI), that measures the relative quality discrepancy of image pairs, thus issuing the biased evaluations caused by unreliable GTs. Our proposed model achieves significantly better consistency with human opinions. We expect our work to provide insights for the SR community on how future datasets, models, and metrics should be developed.

ColorVideoVDP is a video and image quality metric that models spatial and temporal aspects of vision, for both luminance and color. The metric is built on novel psychophysical models of chromatic spatiotemporal contrast sensitivity and cross-channel contrast masking. It accounts for the viewing conditions, geometric, and photometric characteristics of the display. It was trained to predict common video streaming distortions (e.g. video compression, rescaling, and transmission errors), and also 8 new distortion types related to AR/VR displays (e.g. light source and waveguide non-uniformities). To address the latter application, we collected our novel XR-Display-Artifact-Video quality dataset (XR-DAVID), comprised of 336 distorted videos. Extensive testing on XR-DAVID, as well as several datasets from the literature, indicate a significant gain in prediction performance compared to existing metrics. ColorVideoVDP opens the doors to many novel applications which require the joint automated spatiotemporal assessment of luminance and color distortions, including video streaming, display specification and design, visual comparison of results, and perceptually-guided quality optimization.

Vision-language models (VLMs) are increasingly used to detect whether AI-generated images contain visible artifacts, yet their ability to analyze such artifacts remains poorly understood. A correct image-level decision can still hide important failures: a model may correctly flag an artifact while relying on the wrong visual cue, selecting the wrong region, or describing a defect that the image does not support. To evaluate these behaviors directly, we introduce SalArt-VQA, a diagnostic benchmark for fine-grained SALient ARTifact understanding in AI-generated images. SalArt-VQA contains 950 images and 3,681 human-authored multiple-choice questions spanning artifact images, matched real reference images, and paired generated reference images. Four aligned question types evaluate presence detection, semantic localization, spatial grounding, and evidence-grounded defect identification, while the reference splits test calibration and abstention when the annotated defect is absent. Across 20 VLMs, SalArt-VQA reveals failures that image-level detection accuracy hides: the strongest model reaches 99.37% detection recall on artifact images but answers all four artifact-side questions correctly on only 53.26% of images. Comparing artifact images with artifact-free references reveals a sensitivity-calibration tradeoff: sensitive models often make unsupported artifact claims, while conservative models avoid false alarms largely by missing real artifacts. These results show that high artifact detection accuracy alone does not imply grounded artifact understanding. SalArt-VQA exposes these hidden failure modes and provides a fine-grained evaluation of whether VLM artifact claims are supported by local visual evidence.

We discover that common diffusion noise schedules do not enforce the last timestep to have zero signal-to-noise ratio (SNR), and some implementations of diffusion samplers do not start from the last timestep. Such designs are flawed and do not reflect the fact that the model is given pure Gaussian noise at inference, creating a discrepancy between training and inference. We show that the flawed design causes real problems in existing implementations. In Stable Diffusion, it severely limits the model to only generate images with medium brightness and prevents it from generating very bright and dark samples. We propose a few simple fixes: (1) rescale the noise schedule to enforce zero terminal SNR; (2) train the model with v prediction; (3) change the sampler to always start from the last timestep; (4) rescale classifier-free guidance to prevent over-exposure. These simple changes ensure the diffusion process is congruent between training and inference and allow the model to generate samples more faithful to the original data distribution.

To efficiently deploy strong, often pre-trained feature extractors, recent Industrial Anomaly Detection and Segmentation (IADS) methods process low-resolution images, e.g., 224x224 pixels, obtained by downsampling the original input images. However, while numerous industrial applications demand the identification of both large and small defects, downsampling the input image to a low resolution may hinder a method's ability to pinpoint tiny anomalies. We propose a novel Teacher--Student paradigm to leverage strong pre-trained features while processing high-resolution input images very efficiently. The core idea concerns training two shallow MLPs (the Students) by nominal images so as to mimic the mappings between the patch embeddings induced by the self-attention layers of a frozen vision Transformer (the Teacher). Indeed, learning these mappings sets forth a challenging pretext task that small-capacity models are unlikely to accomplish on out-of-distribution data such as anomalous images. Our method can spot anomalies from high-resolution images and runs way faster than competitors, achieving state-of-the-art performance on MVTec AD and the best segmentation results on VisA. We also propose novel evaluation metrics to capture robustness to defect size, i.e., the ability to preserve good localisation from large anomalies to tiny ones. Evaluating our method also by these metrics reveals its neatly superior performance.

The multi-step, iterative image editing capabilities of multi-modal agentic systems have transformed digital content creation. Although latest image editing models faithfully follow instructions and generate high-quality images in single-turn edits, we identify a critical weakness in multi-turn editing, which is the iterative degradation of image quality. As images are repeatedly edited, minor artifacts accumulate, rapidly leading to a severe accumulation of visible noise and a failure to follow simple editing instructions. To systematically study these failures, we introduce Banana100, a comprehensive dataset of 28,000 degraded images generated through 100 iterative editing steps, including diverse textures and image content. Alarmingly, image quality evaluators fail to detect the degradation. Among 21 popular no-reference image quality assessment (NR-IQA) metrics, none of them consistently assign lower scores to heavily degraded images than to clean ones. The dual failures of generators and evaluators may threaten the stability of future model training and the safety of deployed agentic systems, if the low-quality synthetic data generated by multi-turn edits escape quality filters. We release the full code and data to facilitate the development of more robust models, helping to mitigate the fragility of multi-modal agentic systems.

Visual anomaly detection is commonly used in industrial quality inspection. In this paper, we present a new dataset as well as a new self-supervised learning method for ImageNet pre-training to improve anomaly detection and segmentation in 1-class and 2-class 5/10/high-shot training setups. We release the Visual Anomaly (VisA) Dataset consisting of 10,821 high-resolution color images (9,621 normal and 1,200 anomalous samples) covering 12 objects in 3 domains, making it the largest industrial anomaly detection dataset to date. Both image and pixel-level labels are provided. We also propose a new self-supervised framework - SPot-the-difference (SPD) - which can regularize contrastive self-supervised pre-training, such as SimSiam, MoCo and SimCLR, to be more suitable for anomaly detection tasks. Our experiments on VisA and MVTec-AD dataset show that SPD consistently improves these contrastive pre-training baselines and even the supervised pre-training. For example, SPD improves Area Under the Precision-Recall curve (AU-PR) for anomaly segmentation by 5.9% and 6.8% over SimSiam and supervised pre-training respectively in the 2-class high-shot regime. We open-source the project at http://github.com/amazon-research/spot-diff .

Document understanding and GUI interaction are among the highest-value applications of Vision-Language Models (VLMs), yet they impose exceptionally heavy computational burden: fine-grained text and small UI elements demand high-resolution inputs that produce tens of thousands of visual tokens. We observe that this cost is largely wasteful -- across document and GUI benchmarks, only 22--71\% of image patches are pixel-unique, the rest being exact duplicates of another patch in the same image. We propose PixelPrune, which exploits this pixel-level redundancy through predictive-coding-based compression, pruning redundant patches before the Vision Transformer (ViT) encoder. Because it operates in pixel space prior to any neural computation, PixelPrune accelerates both the ViT encoder and the downstream LLM, covering the full inference pipeline. The method is training-free, requires no learnable parameters, and supports pixel-lossless compression (τ{=}0) as well as controlled lossy compression (τ{>}0). Experiments across three model scales and document and GUI benchmarks show that PixelPrune maintains competitive task accuracy while delivering up to 4.2times inference speedup and 1.9times training acceleration. Code is available at https://github.com/OPPO-Mente-Lab/PixelPrune.

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production environment. Therefore, we present the Texture-AD benchmark based on representative texture-based anomaly detection to evaluate the effectiveness of unsupervised anomaly detection algorithms in real-world applications. This dataset includes images of 15 different cloth, 14 semiconductor wafers and 10 metal plates acquired under different optical schemes. In addition, it includes more than 10 different types of defects produced during real manufacturing processes, such as scratches, wrinkles, color variations and point defects, which are often more difficult to detect than existing datasets. All anomalous areas are provided with pixel-level annotations to facilitate comprehensive evaluation using anomaly detection models. Specifically, to adapt to diverse products in automated pipelines, we present a new evaluation method and results of baseline algorithms. The experimental results show that Texture-AD is a difficult challenge for state-of-the-art algorithms. To our knowledge, Texture-AD is the first dataset to be devoted to evaluating industrial defect detection algorithms in the real world. The dataset is available at https://XXX.

In this paper, we introduce an approach for detecting modifications in assembled printed circuit boards based on photographs taken without tight control over perspective and illumination conditions. One instance of this problem is the visual inspection of gas pumps PCBs, which can be modified by fraudsters wishing to deceive costumers or evade taxes. Given the uncontrolled environment and the huge number of possible modifications, we address the problem as a case of anomaly detection, proposing an approach that is directed towards the characteristics of that scenario, while being well-suited for other similar applications. The proposed approach employs a deep convolutional autoencoder trained to reconstruct images of an unmodified board, but which remains unable to do the same for images showing modifications. By comparing the input image with its reconstruction, it is possible to segment anomalies and modifications in a pixel-wise manner. Experiments performed on a dataset built to represent real-world situations (and which we will make publicly available) show that our approach outperforms other state-of-the-art approaches for anomaly segmentation in the considered scenario, while producing comparable results on the popular MVTec-AD dataset for a more general object anomaly detection task.

Too many defective compute chips are escaping existing manufacturing tests -- at least an order of magnitude more than industrial targets across all compute chip types in data centers. Silent data corruptions (SDCs) caused by test escapes, when left unaddressed, pose a major threat to reliable computing. We present a three-pronged approach outlining future directions for overcoming test escapes: (a) Quick diagnosis of defective chips directly from system-level incorrect behaviors. Such diagnosis is critical for gaining insights into why so many defective chips escape existing manufacturing testing. (b) In-field detection of defective chips. (c) New test experiments to understand the effectiveness of new techniques for detecting defective chips. These experiments must overcome the drawbacks and pitfalls of previous industrial test experiments and case studies.

Recently, 3D Gaussian Splatting has demonstrated impressive novel view synthesis results, reaching high fidelity and efficiency. However, strong artifacts can be observed when changing the sampling rate, \eg, by changing focal length or camera distance. We find that the source for this phenomenon can be attributed to the lack of 3D frequency constraints and the usage of a 2D dilation filter. To address this problem, we introduce a 3D smoothing filter which constrains the size of the 3D Gaussian primitives based on the maximal sampling frequency induced by the input views, eliminating high-frequency artifacts when zooming in. Moreover, replacing 2D dilation with a 2D Mip filter, which simulates a 2D box filter, effectively mitigates aliasing and dilation issues. Our evaluation, including scenarios such a training on single-scale images and testing on multiple scales, validates the effectiveness of our approach.